50/100 MHz test rate 1024 digital channel (Max. 1216 digital channel ) All in one: digital 64ch, DPS 8ch, BPMU 1ch & TMU 4ch per board 256 sites parallel test 512M pattern memory 4K capture memory Flexible architecture (any slot, any instrument) Edge Resolution TS0: 4.5 ps , other TS1 ~31: 1ns Support STDF / Dynamic PAT AD/DA function (option 2023Q1) ALPG support memory test C/C++ development environment
